Cher Ming Tan, Zhenghao Gan, Wai Fung Ho, Sam Chen, Robert Liu. Determination of the dice forward I-V characteristics of a power diode from a packaged device and its applications. Microelectronics Reliability, 45(1):179-184, 2005. [doi]
@article{TanGHCL05,
title = {Determination of the dice forward I-V characteristics of a power diode from a packaged device and its applications},
author = {Cher Ming Tan and Zhenghao Gan and Wai Fung Ho and Sam Chen and Robert Liu},
year = {2005},
doi = {10.1016/j.microrel.2004.05.004},
url = {http://dx.doi.org/10.1016/j.microrel.2004.05.004},
researchr = {https://researchr.org/publication/TanGHCL05},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {45},
number = {1},
pages = {179-184},
}