P. J. Tan, Tung Le, Keng-Hian Ng, Prasad Mantri, James Westfall. Testing of UltraSPARC T1 Microprocessor and its Challenges. In Scott Davidson, Anne Gattiker, editors, 2006 IEEE International Test Conference, ITC 2006, Santa Clara, CA, USA, October 22-27, 2006. pages 1-10, IEEE, 2006. [doi]
Abstract is missing.