Reliability-constrained area optimization of VLSI power/ground networks via sequence of linear programmings

Sheldon X.-D. Tan, C.-J. Richard Shi, Jyh-Chwen Lee. Reliability-constrained area optimization of VLSI power/ground networks via sequence of linear programmings. IEEE Trans. on CAD of Integrated Circuits and Systems, 22(12):1678-1684, 2003. [doi]

Abstract

Abstract is missing.