Zhiliang Tan, Peijiao Song, Liyun Ma, Zhaoxiang Meng. Study on the Effect Mechanism of the Bipolar Junction Transistor Caused by ESD. In Xingang Liu, Didier El Baz, Ching-Hsien Hsu, Kai Kang, Weifeng Chen, editors, 17th IEEE International Conference on Computational Science and Engineering, CSE 2014, Chengdu, China, December 19-21, 2014. pages 319-323, IEEE, 2014. [doi]
Abstract is missing.