Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
Y. C. Tan, C. M. Tan, T. C. Ng. Addressing the challenges in solder resistance measurement for electromigration test. Microelectronics Reliability, 50(9-11):1352-1354, 2010. [doi]
Abstract is missing.