Genichi Tanaka, Kan Takeuchi, Minoru Ito, Hiroaki Matsushita. A voltage drop aware crosstalk measurement with multi-aggressors in 65nm process. In Proceedings of the IEEE 2008 Custom Integrated Circuits Conference, CICC 2008, DoubleTree Hotel, San Jose, California, USA, September 21-24, 2008. pages 37-40, IEEE, 2008. [doi]
Abstract is missing.