Yunjie Tang, Kai Sun, Danhuai Zhao, Yan Lu, Jiaju Jiang, Hong Chen. Industrial Defect Detection Through Computer Vision: A Survey. In 7th IEEE International Conference on Data Science in Cyberspace, DSC 2022, Guilin, China, July 11-13, 2022. pages 605-610, IEEE, 2022. [doi]
Abstract is missing.