Optimization of inter-gate-dielectrics in hybrid float gate devices to reduce window instability during memory operations - researchr publication authors

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Baojun Tang, Weidong Zhang, Laurent Breuil, Colin Robinson, Yunqi Wang, Maria Toledano-Luque, Geert Van den bosch, Jianfu Zhang, Jan Van Houdt. Optimization of inter-gate-dielectrics in hybrid float gate devices to reduce window instability during memory operations. Microelectronics Reliability, 54(9-10):2258-2261, 2014. [doi]

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