Baojun Tang, Weidong Zhang, Laurent Breuil, Colin Robinson, Yunqi Wang, Maria Toledano-Luque, Geert Van den bosch, Jianfu Zhang, Jan Van Houdt. Optimization of inter-gate-dielectrics in hybrid float gate devices to reduce window instability during memory operations. Microelectronics Reliability, 54(9-10):2258-2261, 2014. [doi]
@article{TangZBRWTbZH14,
title = {Optimization of inter-gate-dielectrics in hybrid float gate devices to reduce window instability during memory operations},
author = {Baojun Tang and Weidong Zhang and Laurent Breuil and Colin Robinson and Yunqi Wang and Maria Toledano-Luque and Geert Van den bosch and Jianfu Zhang and Jan Van Houdt},
year = {2014},
doi = {10.1016/j.microrel.2014.07.087},
url = {http://dx.doi.org/10.1016/j.microrel.2014.07.087},
researchr = {https://researchr.org/publication/TangZBRWTbZH14},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {54},
number = {9-10},
pages = {2258-2261},
}