Adaptive three-dimensional wavelet analysis for denoising TOF-SIMS images: Toward digital staining of pathological specimens

K. Tanji, M. Komatsu, H. Hashimoto. Adaptive three-dimensional wavelet analysis for denoising TOF-SIMS images: Toward digital staining of pathological specimens. In Yongsheng Ding, Yonghong Peng, Riyi Shi, Kuangrong Hao, Lipo Wang, editors, 4th International Conference on Biomedical Engineering and Informatics, BMEI 2011, Shanghai, China, October 15-17, 2011. pages 100-104, IEEE, 2011. [doi]

Abstract

Abstract is missing.