The Impact of Mislabelling on the Performance and Interpretation of Defect Prediction Models

Chakkrit Tantithamthavorn, Shane McIntosh, Ahmed E. Hassan, Akinori Ihara, Ken-ichi Matsumoto. The Impact of Mislabelling on the Performance and Interpretation of Defect Prediction Models. In 37th IEEE/ACM International Conference on Software Engineering, ICSE 2015, Florence, Italy, May 16-24, 2015, Volume 1. pages 812-823, IEEE, 2015. [doi]

Abstract

Abstract is missing.