Sarmad Tanwir, Michael S. Hsiao, Loganathan Lingappan. A Test Pattern Quality Metric for Diagnosis of Multiple Stuck-at and Transition faults. In Laleh Behjat, Jie Han, Miroslav N. Velev, Deming Chen, editors, Proceedings of the on Great Lakes Symposium on VLSI 2017, Banff, AB, Canada, May 10-12, 2017. pages 455-458, ACM, 2017. [doi]
Abstract is missing.