Yang Tao, Hanyang Xu, Jorge R. Salas Avila, Christos Ktistis, Wuliang Yin, Anthony J. Peyton. Defect Feature Extraction in Eddy Current Testing Based on Convolutional Sparse Coding. In IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2019, Auckland, New Zealand, May 20-23, 2019. pages 1-6, IEEE, 2019. [doi]
Abstract is missing.