Meng-Jai Tasi, Mango C.-T. Chao, Jing-Yang Jou, Meng-Chen Wu. Multiple-Fault Diagnosis Using Faulty-Region Identification. In 27th IEEE VLSI Test Symposium, VTS 2009, May 3-7, 2009, Santa Cruz, California, USA. pages 123-128, IEEE Computer Society, 2009. [doi]
Abstract is missing.