REMAP: a reliability/endurance mechanism for advancing PCM

Mohammad Khavari Tavana, Amir Kavyan Ziabari, Mohammad Arjomand, Mahmut T. Kandemir, Chita R. Das, David R. Kaeli. REMAP: a reliability/endurance mechanism for advancing PCM. In Proceedings of the International Symposium on Memory Systems, MEMSYS 2017, Alexandria, VA, USA, October 02 - 05, 2017. pages 385-398, ACM, 2017. [doi]

No reviews for this publication, yet.