Time-To-Latch-Up investigation of SCR devices as ESD protection structures on 65 nm technology platform - researchr publication

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Augusto Tazzoli, M. Cordoni, P. Colombo, C. Bergonzoni, Gaudenzio Meneghesso. Time-To-Latch-Up investigation of SCR devices as ESD protection structures on 65 nm technology platform. Microelectronics Reliability, 50(9-11):1373-1378, 2010. [doi]

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