iTEM: a temperature-dependent electromigration reliability diagnosis tool

Chin-Chi Teng, Yi-Kan Cheng, Elyse Rosenbaum, Sung-Mo Kang. iTEM: a temperature-dependent electromigration reliability diagnosis tool. IEEE Trans. on CAD of Integrated Circuits and Systems, 16(8):882-893, 1997. [doi]

Abstract

Abstract is missing.