iTEM: a temperature-dependent electromigration reliability diagnosis tool

Chin-Chi Teng, Yi-Kan Cheng, Elyse Rosenbaum, Sung-Mo Kang. iTEM: a temperature-dependent electromigration reliability diagnosis tool. IEEE Trans. on CAD of Integrated Circuits and Systems, 16(8):882-893, 1997. [doi]

Authors

Chin-Chi Teng

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Yi-Kan Cheng

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Elyse Rosenbaum

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Sung-Mo Kang

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