Salient Iso-Surface Detection with Model-Independent Statistical Signatures

Shivaraj Tenginakai, Jinho Lee, Raghu Machiraju. Salient Iso-Surface Detection with Model-Independent Statistical Signatures. In Thomas Ertl, Kenneth I. Joy, Amitabh Varshney, editors, IEEE Visualization 2001, October 24-26, 2001, San Diego, CA, USA, Proceedings. pages 231-238, IEEE Computer Society, 2001. [doi]

Abstract

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