Valerio Terragni, Mauro Pezzè, Francesco Adalberto Bianchi. Coverage-Driven Test Generation for Thread-Safe Classes via Parallel and Conflict Dependencies. In 12th IEEE Conference on Software Testing, Validation and Verification, ICST 2019, Xi'an, China, April 22-27, 2019. pages 264-275, IEEE, 2019. [doi]
Abstract is missing.