Fault Coverage on RF VCOs and BIST for Wafer Sort Using Peak-to-Peak Voltage Detectors

Luca Testa, Hervé Lapuyade, Yann Deval, Jean-Louis Carbonéro, Jean-Baptiste Begueret. Fault Coverage on RF VCOs and BIST for Wafer Sort Using Peak-to-Peak Voltage Detectors. J. Electronic Testing, 26(3):355-365, 2010. [doi]

Abstract

Abstract is missing.