An Architecture for Testable VLSI Processors

Satish M. Thatte, D.-S. Ho, H.-T. Yuan, Thirumalai Sridhar, Theo J. Powell. An Architecture for Testable VLSI Processors. In Proceedings International Test Conference 1982, Philadelphia, PA, USA, November 1982. pages 484-493, IEEE Computer Society, 1982.

Abstract

Abstract is missing.