Noise-induced dynamic variability in nano-scale CMOS SRAM cells

Christoforos G. Theodorou, Mouenes Fadlallah, Xavier Garros, Charalambos A. Dimitriadis, GĂ©rard Ghibaudo. Noise-induced dynamic variability in nano-scale CMOS SRAM cells. In 46th European Solid-State Device Research Conference, ESSDERC 2016, Lausanne, Switzerland, September 12-15, 2016. pages 256-259, IEEE, 2016. [doi]

Abstract

Abstract is missing.