Thiagarajan Trichy, Peter Sandborn, Ravi Raghavan, Shubhada Sahasrabudhe. A new test/diagnosis/rework model for use in technical cost modeling of electronic systems assembly. In Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October - 1 November 2001. pages 1108-1117, IEEE Computer Society, 2001.
Abstract is missing.