Nilesh Kumar Tiwari, Surya P. Singh, Abhishek Kumar Jha, M. Jaleel Akhtar. Simplified Approach for Broadband RF Testing of Low Loss Magneto-Dielectric Samples. IEEE T. Instrumentation and Measurement, 69(5):2248-2257, 2020. [doi]
@article{TiwariSJA20,
title = {Simplified Approach for Broadband RF Testing of Low Loss Magneto-Dielectric Samples},
author = {Nilesh Kumar Tiwari and Surya P. Singh and Abhishek Kumar Jha and M. Jaleel Akhtar},
year = {2020},
doi = {10.1109/TIM.2019.2922749},
url = {https://doi.org/10.1109/TIM.2019.2922749},
researchr = {https://researchr.org/publication/TiwariSJA20},
cites = {0},
citedby = {0},
journal = {IEEE T. Instrumentation and Measurement},
volume = {69},
number = {5},
pages = {2248-2257},
}