Defect-centric perspective of time-dependent BTI variability

M. Toledano-Luque, Ben Kaczer, Jacopo Franco, Philippe Roussel, Tibor Grasser, Guido Groeseneken. Defect-centric perspective of time-dependent BTI variability. Microelectronics Reliability, 52(9-10):1883-1890, 2012. [doi]

@article{Toledano-LuqueKFRGG12,
  title = {Defect-centric perspective of time-dependent BTI variability},
  author = {M. Toledano-Luque and Ben Kaczer and Jacopo Franco and Philippe Roussel and Tibor Grasser and Guido Groeseneken},
  year = {2012},
  doi = {10.1016/j.microrel.2012.06.120},
  url = {http://dx.doi.org/10.1016/j.microrel.2012.06.120},
  researchr = {https://researchr.org/publication/Toledano-LuqueKFRGG12},
  cites = {0},
  citedby = {0},
  journal = {Microelectronics Reliability},
  volume = {52},
  number = {9-10},
  pages = {1883-1890},
}