Defect-centric perspective of time-dependent BTI variability

M. Toledano-Luque, Ben Kaczer, Jacopo Franco, Philippe Roussel, Tibor Grasser, Guido Groeseneken. Defect-centric perspective of time-dependent BTI variability. Microelectronics Reliability, 52(9-10):1883-1890, 2012. [doi]