Shigeki Tomishima, Hiroaki Tanizaki, Mitsutaka Niiro, Masanao Maruta, Hideto Hidaka, T. Tada, Kenji Gamo. A Variable Drivability (VD) Output Buffer for the System In a Package (SIP) and High Frequency Wafer Test. In Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002. pages 170-177, IEEE Computer Society, 2002. [doi]
Abstract is missing.