Physically-based extraction methodology for accurate MOSFET degradation assessment

Giulio Torrente, Jean Coignus, Sophie Renard, Alexandre Vernhet, Gilles Reimbold, David Roy 0001, GĂ©rard Ghibaudo. Physically-based extraction methodology for accurate MOSFET degradation assessment. Microelectronics Reliability, 55(9-10):1417-1421, 2015. [doi]

Abstract

Abstract is missing.