Aymen Touati, Alberto Bosio, Patrick Girard 0001, Arnaud Virazel, Paolo Bernardi, Matteo Sonza Reorda. Improving the Functional Test Delay Fault Coverage: A Microprocessor Case Study. In IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2016, Pittsburgh, PA, USA, July 11-13, 2016. pages 731-736, IEEE, 2016. [doi]
Abstract is missing.