On the reliability assessment of trench fieldstop IGBT under atmospheric neutron spectrum

André Touboul, L. Foro, Frederic Wrobel, Frédéric Saigné. On the reliability assessment of trench fieldstop IGBT under atmospheric neutron spectrum. Microelectronics Reliability, 52(1):124-129, 2012. [doi]

Abstract

Abstract is missing.