Y. Toumi, A. Mouttou, Florian Lemarchand, Guillaume Demésy, C. Koc, D. Muriaux, A. Moreau, J. Lumeau, C. Favard, Aude L. Lereu. Resonant Multi-Dielectric Coverslip for Enhanced Total Internal Reflection Fluorescence Microscopy. In 23rd International Conference on Transparent Optical Networks, ICTON 2023, Bucharest, Romania, July 2-6, 2023. pages 1-3, IEEE, 2023. [doi]
@inproceedings{ToumiMLDKMMLFL23,
title = {Resonant Multi-Dielectric Coverslip for Enhanced Total Internal Reflection Fluorescence Microscopy},
author = {Y. Toumi and A. Mouttou and Florian Lemarchand and Guillaume Demésy and C. Koc and D. Muriaux and A. Moreau and J. Lumeau and C. Favard and Aude L. Lereu},
year = {2023},
doi = {10.1109/ICTON59386.2023.10207549},
url = {https://doi.org/10.1109/ICTON59386.2023.10207549},
researchr = {https://researchr.org/publication/ToumiMLDKMMLFL23},
cites = {0},
citedby = {0},
pages = {1-3},
booktitle = {23rd International Conference on Transparent Optical Networks, ICTON 2023, Bucharest, Romania, July 2-6, 2023},
publisher = {IEEE},
isbn = {979-8-3503-0303-2},
}