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An Analysis of the Die Testing Process Using Taguchi Techniques and Circuit Diagnostics

Robert Trahan, Rex Kiang. An Analysis of the Die Testing Process Using Taguchi Techniques and Circuit Diagnostics. In Proceedings IEEE International Test Conference 1992, Discover the New World of Test and Design, Baltimore, Maryland, USA, September 20-24, 1992. pages 260-269, IEEE Computer Society, 1992.

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