Marcello Traiola, Arnaud Virazel, Patrick Girard 0001, Mario Barbareschi, Alberto Bosio. Towards digital circuit approximation by exploiting fault simulation. In 2017 IEEE East-West Design & Test Symposium, EWDTS 2017, Novi Sad, Serbia, September 29 - October 2, 2017. pages 1-7, IEEE Computer Society, 2017. [doi]
Abstract is missing.