Transient voltage overshoot in TLP testing - Real or artifact?

D. Trémouilles, S. Thijs, Philippe Roussel, M. I. Natarajan, Vesselin K. Vassilev, Guido Groeseneken. Transient voltage overshoot in TLP testing - Real or artifact?. Microelectronics Reliability, 47(7):1016-1024, 2007. [doi]

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