JTAG-based vector and chain management for system test

Bradford G. Van Treuren, Bryan E. Peterson, José M. Miranda. JTAG-based vector and chain management for system test. In Proceedings 2005 IEEE International Test Conference, ITC 2005, Austin, TX, USA, November 8-10, 2005. pages 10, IEEE, 2005. [doi]

Abstract

Abstract is missing.