Satya Trinadh, Ch. Sobhan Babu, Shiv Govind Singh, Seetal Potluri, V. Kamakoti. DP-fill: a dynamic programming approach to X-filling for minimizing peak test power in scan tests. In Wolfgang Nebel, David Atienza, editors, Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition, DATE 2015, Grenoble, France, March 9-13, 2015. pages 836-841, ACM, 2015. [doi]
Abstract is missing.