Mike Tripp, T. M. Mak, Anne Meixner. Elimination of Traditional Functional Testing of Interface Timings at Intel. In Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA. pages 1014-1022, IEEE Computer Society, 2003. [doi]
Abstract is missing.