Huan-Chih Tsai, Sudipta Bhawmik, Kwang-Ting Cheng. An almost full-scan BIST solution-higher fault coverage and shorter test application time. In Proceedings IEEE International Test Conference 1998, Washington, DC, USA, October 18-22, 1998. pages 1065, IEEE Computer Society, 1998. [doi]
Abstract is missing.