1D-based defect detection in patterned TFT-LCD panels using characteristic fractal dimension and correlations

Du-Ming Tsai, Su-Ta Chuang. 1D-based defect detection in patterned TFT-LCD panels using characteristic fractal dimension and correlations. Mach. Vis. Appl., 20(6):423-434, 2009. [doi]

Abstract

Abstract is missing.