Hui-Wen Tsai, Ming-Dou Ker. Design of 2�?VDD-Tolerant I/O Buffer with Considerations of Gate-Oxide Reliability and Hot-Carrier Degradation. In 14th IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2007, Marrakech, Morocco, December 11-14, 2007. pages 1240-1243, IEEE, 2007. [doi]
Abstract is missing.