MINVDD Testing for Weak CMOS ICs

Chao-Wen Tseng, Ray Chen, Edward J. McCluskey, Phil Nigh. MINVDD Testing for Weak CMOS ICs. In 19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA, USA. pages 339-345, IEEE Computer Society, 2001. [doi]

Abstract

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