Hsiao-Yin Tseng, I-Wei Chiu, Mu-Ting Wu, James Chien-Mo Li. Machine Learning-Based Test Pattern Generation for Neuromorphic Chips. In IEEE/ACM International Conference On Computer Aided Design, ICCAD 2021, Munich, Germany, November 1-4, 2021. pages 1-7, IEEE, 2021. [doi]
Abstract is missing.