Chao-Wen Tseng, Subhasish Mitra, Edward J. McCluskey, Scott Davidson. An Evaluation of Pseudo Random Testing for Detecting Real Defects. In 19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA, USA. pages 404-410, IEEE Computer Society, 2001. [doi]
Abstract is missing.