A Versatile Built-In Self-Test Scheme for Delay Fault Testing - researchr publication related

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Y. Tsiatouhas, Th. Haniotakis, Angela Arapoyanni, Dimitris Nikolos. A Versatile Built-In Self-Test Scheme for Delay Fault Testing. In 2000 Design, Automation and Test in Europe (DATE 2000), 27-30 March 2000, Paris, France. pages 756, IEEE Computer Society, 2000. [doi]

The following publications are possibly variants of this publication:

A Zero Aliasing Built-In Self Test Technique for Delay Fault TestingY. Tsiatouhas, Th. Haniotakis. dft 1999: 95-100 [doi]

An efficient built-in self test method for robust path delay fault testingIoannis Voyiatzis, Antonis M. Paschalis, Dimitris Nikolos, Constantin Halatsis. et, 8(2):219-222, 1996. [doi]

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