Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Aida Todri, Arnaud Virazel, Antoine D. Touboul, Frederic Wrobel, Frédéric Saigné. Evaluation of test algorithms stress effect on SRAMs under neutron radiation. In 18th IEEE International On-Line Testing Symposium, IOLTS 2012, Sitges, Spain, June 27-29, 2012. pages 121-122, IEEE Computer Society, 2012. [doi]
Abstract is missing.