Similarities of lag phenomena and current collapse in field-plate AlGaN/GaN HEMTs with different types of buffer layers

Ryouhei Tsurumaki, Naohiro Noda, Kazushige Horio. Similarities of lag phenomena and current collapse in field-plate AlGaN/GaN HEMTs with different types of buffer layers. Microelectronics Reliability, 73:36-41, 2017. [doi]

Abstract

Abstract is missing.