Burak Turhan, Ayse Basar Bener, Tim Menzies. Nearest neighbor sampling for cross company defect predictors: abstract only. In Premkumar T. Devanbu, Brendan Murphy, Nachiappan Nagappan, Thomas Zimmermann, editors, Proceedings of the 2008 Workshop on Defects in Large Software Systems, held in conjunction with the ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA 2008), DEFECTS 2008, Seattle, Washington, USA, July 20, 2008. pages 26, ACM, 2008. [doi]
Abstract is missing.