Javier Tuya, Claudio de la Riva, María José Suárez Cabal, Raquel Blanco. Coverage-Aware Test Database Reduction. IEEE Trans. Software Eng., 42(10):941-959, 2016. [doi]
@article{TuyaRCB16,
title = {Coverage-Aware Test Database Reduction},
author = {Javier Tuya and Claudio de la Riva and María José Suárez Cabal and Raquel Blanco},
year = {2016},
doi = {10.1109/TSE.2016.2519032},
url = {http://doi.ieeecomputersociety.org/10.1109/TSE.2016.2519032},
researchr = {https://researchr.org/publication/TuyaRCB16},
cites = {0},
citedby = {0},
journal = {IEEE Trans. Software Eng.},
volume = {42},
number = {10},
pages = {941-959},
}