Stanislav Tyaginov, Ivan Starkov, Hubert Enichlmair, C. Jungemann, Jong Mun Park, E. Seebacher, R. L. de Orio, Hajdin Ceric, Tibor Grasser. An analytical approach for physical modeling of hot-carrier induced degradation. Microelectronics Reliability, 51(9-11):1525-1529, 2011. [doi]
Abstract is missing.